The peak power of narrow pulsed semiconductor laser arrays should be measured accurately,and the measurement accuracy is directly related to the quality of photoelectric system.In this paper,a measurement technique for measuring the peak power of narrow pulsed semiconductor laser arrays is proposed.The technique collect the data by logarithmic amplification technology and 8051F020 single chip microcomputer.The peak power is measured directly by broadening pulse width,holding peak and resetting with discharging rapidly.The test results show that the calibration error is less than 3%,the measurement accuracy is high,and the repeated measurement error is within 1.7%.The instrument developed by this method has the characteristics of portability,fast test speed and low cost,and has waveform output interface,which is suitable for the rapid test with limited space.