文中介绍了半导体激光二极管(LD) 寿命测试的理论依据,给出了寿命测试的数学模 型,并据此设计了LD 高温加速寿命自动测试系统。系统通过采集恒流工作LD 的平均输出光功率随时间变化的信息,绘制LD 的老化曲线,即恒流条件下的P - t 曲线,或通过采集恒功工作LD 的工作电流随时间变化的信息,即恒功条件下的I - t 曲线,然后推断LD 正常条件下的使用寿命。
Abstract:
The theory of Laser Diode life testing and mathematic model of life testing were introduced , and a high-temperature accelerating LDs automatic life testing system was developed from these. By sampling the power/ current of LDs ,which works under automatic current control (ACC) / automatic power control (APC) , power2time (P2t) / current2time ( I2t) curve of LDs is ploted , and thus concludes the normal working life of LDs.
