The fabrication of harmonic beam splitter for 532nm wavelength green light laser with dual ion beam sputtering(DIBS) technology was studied. The layers′ thickness was monitored by time. Against the half wave hole phenomenon, based on analyzing it′s forming mechanism, the group optimizing method was adopted to modify lays′ thickness. Then, the high quality harmonic beam splitter without half wave hole was obtained. It also presented a feasible method to modify layers′ thickness of irregular coating system monitored by time.
参考文献
相似文献
引证文献
引用本文
袁宏韬,张贵彦.时间监控离子束溅射沉积倍频波长分离膜[J].激光与红外,2007,37(4):370~372 YUAN Hong-tao, ZHANG Gui-yan. Ion Beam Sputter Depositing Harmonic Beam Splitter by Timepower Monitoring Method[J]. LASER & INFRARED,2007,37(4):370~372