This article presents the result of LPE CdZnTe on CdZnTe substrates. The CdZnTe epilayer was characterized with Xray diffraction, Xray topography, SIMS and FTIR. The LPE CdZnTe films on CdZnTe substrate show good composition and uniformity, good crystal quality. The impurity between HgCdTe and CdZnTe buffer layer is controlled very well by this HgCdTe/CdZnTe/CdZnTe structure.
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周立庆,刘兴新,巩锋,胡尚正.碲锌镉缓冲层液相外延技术的研究[J].激光与红外,2007,37(13):907~909 ZHOU Li-qing, LIU Xing-xin, GONG Feng, HU Shang-zheng. LPE Growth of CdZnTe Buffer Layers on CdZnTe Substrates[J]. LASER & INFRARED,2007,37(13):907~909