正照射与背照射InGaAs探测器的性能对比研究
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国家自然科学基金重点项目(No.50632060)


Performance Comparision of Frontilluminated and Backilluminated InGaAs Detectors
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    摘要:

    首先介绍了InGaAs台面探测器的研究进展,然后为了验证利用台面结制作背照射器件的可行性,利用分子束外延(MBE)方法生长的掺杂InGaAs吸收层PIN InP/InGaAs/InP双异质结外延材料,通过台面制作、钝化、电极生长、背面抛光等工艺,制备了8元台面InGaAs探测器,并测试了正照射和背照射时,器件的I-V、信号和响应光谱。测试结果表明,正照射和背照射情况下,器件的响应信号差别不大,正照射下器件的平均峰值探测率为4.1×1011cm·Hz1/2·W-1,背照射下器件的平均峰值探测率为4.0×1011cm·Hz1/2·W-1,但背照射情况下器件的响应光谱在短波方向有更好的截止。

    Abstract:

    The development of InGaAs mesa detectors were presented briefly, then in order to verify the feasibility of fabricating backilluminated detectors by mesa junction, 8×1 elements mesa InGaAs detector arrays were made based on dopedInGaAs absorbing layer in MBEgrown PIN InP/InGaAs/InP doubleheterostructure epitaxial materials, with the technics of mesamaking, passivation, growth of electrode, backside polishing and so on.IV curves, response spectra and the signal of the detector were measured at the frontilluminated or backilluminated condition. The results indicate that the signal is almost same at the frontilluminated and backilluminated condition. The mean peak detectivity is 4.1×1011cm·Hz1/2·W-1 at the frontilluminated condition while it is 4.0×1011cm·Hz1/2·W-1 at the backilluminated condition, but the response spectra of the detectors has better cutoff characteristic at the backilluminated condition.

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唐恒敬,吕衍秋,吴小利,张可锋,李雪,龚海梅.正照射与背照射InGaAs探测器的性能对比研究[J].激光与红外,2007,37(13):938~940
TANG Heng-jing, Lü Yan-qiu, WU Xiao-li, ZHANG Ke-feng, LI Xue, GONG Hai-mei. Performance Comparision of Frontilluminated and Backilluminated InGaAs Detectors[J]. LASER & INFRARED,2007,37(13):938~940

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