The performance of GaN-based Schottky device was simulated numerically based on a two-dimensional model,which focused on the effect of interface layer and bulk layer to electric characteristics,i.e.distribution of strength of electric field and current-voltage characteristic of different MIS Schottky devices.The results indicated that the interface layer mainly affects the current characteristic of device and turn-on voltage,improves the strength of electric field and reduces the dark current,and the bulk layer mainly affects the distribution of electric field and the forward current of device.We can optimize the fabric and improve the performance of devices.
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胡其欣,许金通,储开慧,李向阳,刘骥. GaN肖特基器件电学性质的模拟研究[J].激光与红外,2008,38(9):902~905 HU Qi-xin, XU Jin-tong, CHU Kai-hui, LI Xiang-yang, LIU Ji. Numerical Modeling of Electric Characteristics of GaN-based Schottky Device[J]. LASER & INFRARED,2008,38(9):902~905