In this paper we put forward a design for the angle measurement device with 1-D defect photonic crystal.The 1-D defect photonic crystal is made up of Si thin film and SiO2 thin film.We investigate the variety law of the defect modes as the incident angle has small changes by means of eigen matrix.Accordingly we put forward three ways of angle measurement:using the relationships between the wavelength of defect modes and incident angle,using the relationships between the transmittances of defect modes and incident angle and using the relationships between the polarizations of defect modes and incident angle.The virtue of our design is that it can measure very small angle change precisely.