近红外InGaAs探测器台面结构对器件性能的影响
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国家自然科学基金重点项目(No.50632060);中国科学院知识创新工程青年人才领域前沿项目(No.C2-32),(No.C2-50)资助


Influence of mesa structure on the characteristics of the near infrared InGaAs photodiodes
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    摘要:

    采用湿法腐蚀方式在PIN型InP/In0.53Ga0.47As/InP材料上制备了不同台面结构的正照射In0.53Ga0.47As探测器,通过比较不同结构器件的性能,如暗电流、信号、噪声,研究了器件性能跟器件结构之间的关系,并分析影响器件性能的因素。研究结果表明,探测器的暗电流、噪声与台面面积是成线性关系的,而信号与台面面积则不是线性关系。探测器的台面可分为光敏区和光敏区外部分,光敏区外部分对暗电流、噪声的贡献与光敏区是一致的,但对信号的贡献这两部分则是不一致的,这主要是由于衬底反射和器件之间的沟道光生载

    Abstract:

    Front illuminated In0.53Ga0.47As photodiodes with different mesa structures were fabricated on the materials of PIN InP/ In0.53Ga0.47As /InP by wet etching.The characteristics of these diodes,such as dark current,signal and noise were compared,and the influence of mesa structures was analyzed.The results indicated that the dark current and noise of diodes are linear with mesa area,but the signal is not.Mesa of diode consists of the sensitivity area and the outside section of the sensitivity area.The outside section of the sensitivity area does contributions to the dark current and noise in the same way as sensitivity area,but the outside section′s contribution to the signal is not in accord with the one of the sensitivity area.That is mainly because of the reflection of substrate and the transverse diffusion of carriers generated by the absorption in the spacing between pixels.

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朱耀明,李永富,唐恒敬,汪洋,李淘,李雪,龚海梅.近红外InGaAs探测器台面结构对器件性能的影响[J].激光与红外,2010,40(2):169~173
ZHU Yao-ming, LI Yong-fu, TANG Heng-jing, WANG Yang, LI Tao, LI Xue, GONG Hai-mei. Influence of mesa structure on the characteristics of the near infrared InGaAs photodiodes[J]. LASER & INFRARED,2010,40(2):169~173

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