基于幅频特性曲线的光电经纬仪跟踪性能评价
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Evaluating the tracking performance of photoelectric theodolite by using the amplitude frequency characteristic curve
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    摘要:

    提出了一种测试光电经纬仪幅频特性曲线以及利用该特性曲线评价伺服控制系统跟踪性能的方法。论证了利用频率特性、传递函数、微分(或差分)方程描述同一个系统时所具有的等价关系,给出了利用光电经纬仪幅频特性曲线评价跟踪性能的意义和优势。描述了动态靶标连续调频运动模式下,光电经纬仪跟踪靶标目标时跟踪误差信号的WVD分布。通过分析跟踪误差的WVD分布可知跟踪误差信号为一系列谐波信号的叠加,因目前缺少准确分离该谐波信号的工具和算法,导致无法利用时频分析工具获取幅频特性曲线。因此提出采用间接方式利用线性调频信号测试光电经纬仪幅频特性曲线。最后给出了利用特性曲线评价光电经纬仪跟踪伺服系统性能的方法。

    Abstract:

    A novel approach is proposed to evaluate the tracking performance of photoelectric theodolite by testing its amplitude frequency characteristic curve.A method of testing the amplitude frequency curve is also given.At first,this paper analyzes the equivalence relations of describing a system using frequency characteristic,transfer functions,and differential equations(difference equations).And then,the significance and the advantage of evaluating the tracking performance using the amplitude frequency characteristic curve of photoelectric theodolite are expatiated.The character of Wigner Ville distribution of tracking error which is gotten by tracking the optic dynamic target is described,when the frequency optic dynamic target is modulated continuously.The tracking error signal can be represented by a finite number of weighted sums for the base frequency harmonic and high harmonics,based on the characters of tracking error′s WVD.However,because of the lack of the scientific means to separate the harmonic components accurately,it cannot test the frequency characteristic curves using the time-frequency distribution.In this case,an indirect approach that test the amplitude frequency characteristic curve of photoelectric theodolite by using the line frequency modulation(LFM) signal is introduced.At last,the tracking performance and characteristic of the photoelectric theodolite are analyzed based on the amplitude frequency characteristic curve.

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张宁,沈湘衡.基于幅频特性曲线的光电经纬仪跟踪性能评价[J].激光与红外,2011,41(7):793~799
ZHANG Ning, SHEN Xiang-heng. Evaluating the tracking performance of photoelectric theodolite by using the amplitude frequency characteristic curve[J]. LASER & INFRARED,2011,41(7):793~799

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