This paper introduces an aging test system for Infrared Detector Dewar Cooler Assembly (IDDCA).The system provides a platform to implement the detector′ lifespan test continuously and automatically,in each cooling cycle the detector is applied a large temperature range for a long time until it breaks down.The system can shorten the whole aging test process and save a large amount of labor and time.
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张研,赵玲,王南.红外焦平面探测器组件老化试验系统的研制[J].激光与红外,2012,42(7):766~769 ZHANG Yan, ZHAO Ling, WANG Nan. Study on infrared focal plane array′s lifetime testing system[J]. LASER & INFRARED,2012,42(7):766~769