Effect of TCR correction on microbridge thermal conductance test for uncooled detectors
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摘要:
VO2薄膜的电阻温度系数TCR(Temperature Coefficient of Resistance,用α表示)随温度改变会发生显著变化。因此,以VO2薄膜为热敏材料的非制冷探测器微桥像元采用1/R—(-αI2)曲线来测量微桥热导时,如果使用固定TCR数值,必然会对测量结果带来偏差。本文采用TCR逐点矫正的方法测量了非制冷微桥热导,并分析了有效热导,实验中的最大热导矫正率达到20.08%。采用本方法可使非制冷探测器微桥的热导测试结果更为准确,也更具有实际应用价值。
Abstract:
TCR (Temperature coefficient of resistance,α) of the VO2 thin film changes with temperature. So when the thermal conductance of VO2 microbridge pixel is tested by using the 1/R(-αI2) curve method, certain deviation occurs if the TCR is treated as a constant. The test on the microbridge thermal conductance of the uncooled detector is carried out by using the TCR corrected 1/R-(-αI2) curve method and effective thermal conductance is analyzed. The biggest correction ratio reached 20.08% in the experiment. This method makes the thermal conductance test of the uncooled detector more precise and more practical.
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邱宇峰,金晶,翟厚明. TCR矫正对非制冷探测器微桥热导测试的影响[J].激光与红外,2014,44(6):629~632 QIU Yu-feng, JIN Jing, ZHAI Hou-ming. Effect of TCR correction on microbridge thermal conductance test for uncooled detectors[J]. LASER & INFRARED,2014,44(6):629~632