The screening of infrared focal plane detectors needs special testing system.As a basic module in the testing system，driving circuit plays an important role in the testing system.A novel driving circuit was designed.The bias voltages，sequential logical circuits and the signal outputs of this driving circuit were described respectively.And some optimization measures were applied in the whole design.The testing results show that this circuit has a lower noise，and it also possesses the advantages of high controllability and strong commonality.