CaF2基底上近红外区宽带增透膜的研究
DOI:
作者:
作者单位:

作者简介:

通讯作者:

中图分类号:

基金项目:


Study on near infrared broadband anti-reflection film on CaF2 substrate
Author:
Affiliation:

Fund Project:

  • 摘要
  • |
  • 图/表
  • |
  • 访问统计
  • |
  • 参考文献
  • |
  • 相似文献
  • |
  • 引证文献
  • |
  • 资源附件
  • |
  • 文章评论
    摘要:

    以CaF2为基底设计了一种近红外区的宽带增透膜,增透波长为0.9~1.7 μm。分析了宽带增透膜初始结构的基本设计原则。分别以TiO2和SiO2作为高低折射率材料,采用电子束蒸发物理气相沉积(EBPVD)的方法进行工艺制备。利用岛津分光光度计对样品的透过率进行测量,样品双面镀制该膜系,测试结果表明样品的平均透过率达98.95%,与设计结果基本符合,具有宽带的增透特性。环境测试表明:该薄膜具有良好的附着力和牢固度,可以应用于对产品可靠性要求较高的环境中。

    Abstract:

    A near infrared broadband anti-reflection coating was designed on CaF2 substrate,and its wavelength range is from 0.9 μm to 1.7 μm.The basic design principle of the initial structure of the broadband antireflection film was analyzed.The films were fabricated by electron beam physical vapor deposition(EBPVD).Titanium oxide(TiO2) and silicon oxide(SiO2) were used as high index and low index material in this process.The transmittance of the sample was measured by spectrophotometer,and the broadband anti-reflection films were coated on both sides.The test result indicates that its average transmittance is about 98.95% which is consistent with the design result.Environment test indicates that the films have good performances on stability and firmness.It can be used in some rigorous environments.

    参考文献
    相似文献
    引证文献
引用本文

孙亚军,朱益清,李帅,朱华新. CaF2基底上近红外区宽带增透膜的研究[J].激光与红外,2016,46(1):76~80
SUN Ya-jun, ZHU Yi-qing, LI Shuai, ZHU Hua-xin. Study on near infrared broadband anti-reflection film on CaF2 substrate[J]. LASER & INFRARED,2016,46(1):76~80

复制
分享
文章指标
  • 点击次数:
  • 下载次数:
  • HTML阅读次数:
  • 引用次数:
历史
  • 收稿日期:
  • 最后修改日期:
  • 录用日期:
  • 在线发布日期: 2016-01-20
  • 出版日期: