Noise analysis of infrared imaging device is one of important components of infrared image simulation.The components and characteristics of noises for FPA infrared imaging device are analyzed in the paper.These noises can be decomposed into non-uniformity noise,non-uniformity excursion noise and random noise.The calculation process and the digital feature of the noise of staring imaging device and scanning imaging device are analyzed.The non-uniformity noise matrix (or vector),characteristic parameter matrix of non-uniformity excursion noise,characteristic parameter matrix (or vector) of random noise can be calculate from test image data.Non-uniformity excursion noise obeys the linear relationship in a short time.Random noise obeys normal distribution.The noises simulation process of FPA base on test noise data is presented.
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樊宏杰,邹前进,刘连伟,姚梅,陈洁.焦平面阵列红外成像设备噪声特性分析及仿真[J].激光与红外,2019,49(7):855~860 FAN Hong-jie, ZOU Qian-jin, LIU Lian-wei, YAO Mei, CHEN Jie. Noise analysis and simulation of FPA infrared imaging device[J]. LASER & INFRARED,2019,49(7):855~860