Infrared image generation technology is one of the key technologies for constructing infrared imaging semi-physical simulation system.Among them,the resistance array as a projection device has been a research hotspot,and it has inherent defects of non-uniformity.As a test method for non-uniformity correction,sparse grid method and full-screen test method have been proposed by foreign researchers for a long time,and have achieved good correction results.Recently,with the follow-up of the development of resistor arrays in China,the correction method has been continuously updated.In this paper,the inverse sparse grid method is introduced and a simplified calibration process is proposed for the characteristics of the domestic resistance array response curve.The blind iterative correction method is improved on the basis of the sparse grid lighting mode,and then the two correction methods are compared and verified to improve the correction accuracy.