Dark currents in HgCdTe detectors are typically tested in a state where they cannot be exposed to external thermal radiation. This method requires testing in special Dewar structures and can only be tested in the laboratory. In this paper introduces a method to evaluate dark current of long wave infrared HgCdTe detector in common Dewar structure. The method does not need to change the structure of the component but can get the dark current value only through the conventional performance test and calculation by theoretical formula. The test results of the 320×256 LW infrared detector show that the dark current obtained by this method is very close to the dark current obtained in the laboratory,so can be used as a quick method to evaluate the dark current in the infrared focal plane detector.
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王亮,徐长彬.一种碲镉汞长波红外探测器暗电流测试方法[J].激光与红外,2020,50(5):563~566 WANG Liang, XU Chang-bin. The method of dark currents measurement in infrared long wave HgCdTe detector[J]. LASER & INFRARED,2020,50(5):563~566